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selftests/mm: va_high_addr_switch: reduce test noise
JIRA: https://issues.redhat.com/browse/RHEL-85318
commit 85e8bcb
Author: Dev Jain <[email protected]>
Date: Wed May 22 12:34:34 2024 +0530
selftests/mm: va_high_addr_switch: reduce test noise
Patch series "Restructure va_high_addr_switch".
The va_high_addr_switch memory selftest tests out some corner cases
related to allocation and page/hugepage faulting around the switch
boundary. Currently, the page size and hugepage size have been statically
defined. Post FEAT_LPA2, the Aarch64 Linux kernel adds support for 4k and
16k translation granules on higher addresses; we restructure the test to
support the same. In addition, we avoid invocation of the binary twice,
in the shell script, to reduce test noise.
This patch (of 2):
When invoking the binary with "--run-hugetlb" flag, the testcases
involving the base page are anyways going to be run. Therefore, remove
duplication by invoking the binary only once.
Link: https://lkml.kernel.org/r/[email protected]
Link: https://lkml.kernel.org/r/[email protected]
Signed-off-by: Dev Jain <[email protected]>
Cc: Anshuman Khandual <[email protected]>
Cc: Kirill A. Shutemov <[email protected]>
Cc: Shuah Khan <[email protected]>
Signed-off-by: Andrew Morton <[email protected]>
Signed-off-by: Li Wang <[email protected]>
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