|
6 | 6 | "/ENTRY[entry]/experiment_institution": "Deutsches Elektronen-Synchrotron DESY", |
7 | 7 | "/ENTRY[entry]/experiment_facility": "Free-Electron Laser FLASH", |
8 | 8 | "/ENTRY[entry]/experiment_laboratory": "@attrs:metadata/creationLocation", |
9 | | - "/ENTRY/entry_identifier": { |
10 | | - "identifier":"@attrs:metadata/pid" |
11 | | - }, |
| 9 | + "/ENTRY/identifierNAME[entry_identifier]": "@attrs:metadata/pid", |
12 | 10 | "/ENTRY[entry]/USER[user0]": { |
13 | 11 | "name": "!@attrs:metadata/principalInvestigator", |
14 | 12 | "role": "Principal investigator", |
|
48 | 46 | "value/@units": "@attrs:metadata/scientificMetadata/sample/sample_pressure/unit" |
49 | 47 | } |
50 | 48 | }, |
51 | | - "/ENTRY[entry]/INSTRUMENT[instrument]/ELECTRONANALYSER[electronanalyser]": { |
| 49 | + "/ENTRY[entry]/INSTRUMENT[instrument]/ELECTRONANALYZER[electronanalyzer]": { |
52 | 50 | "description": "HEXTOF Momentum Microscope", |
53 | 51 | "device_information": { |
54 | 52 | "vendor": "None", |
|
78 | 76 | "type": "estimated" |
79 | 77 | } |
80 | 78 | }, |
81 | | - "/ENTRY[entry]/INSTRUMENT[instrument]/ELECTRONANALYSER[electronanalyser]/COLLECTIONCOLUMN[collectioncolumn]": { |
| 79 | + "/ENTRY[entry]/INSTRUMENT[instrument]/ELECTRONANALYZER[electronanalyzer]/COLLECTIONCOLUMN[collectioncolumn]": { |
82 | 80 | "projection": "@attrs:metadata/scientificMetadata/Collection/projection", |
83 | 81 | "scheme": "momentum dispersive", |
84 | 82 | "lens_mode": "@attrs:metadata/scientificMetadata/Collection/lens_mode", |
|
107 | 105 | } |
108 | 106 | } |
109 | 107 | }, |
110 | | - "/ENTRY[entry]/INSTRUMENT[instrument]/ELECTRONANALYSER[electronanalyser]/ENERGYDISPERSION[energydispersion]": { |
| 108 | + "/ENTRY[entry]/INSTRUMENT[instrument]/ELECTRONANALYZER[electronanalyzer]/ENERGYDISPERSION[energydispersion]": { |
111 | 109 | "pass_energy": "@attrs:metadata/scientificMetadata/Collection/tof_voltage", |
112 | 110 | "pass_energy/@units": "V", |
113 | 111 | "scheme": "tof", |
114 | 112 | "tof_distance": 0.8, |
115 | 113 | "tof_distance/@units": "m" |
116 | 114 | }, |
117 | | - "/ENTRY[entry]/INSTRUMENT[instrument]/ELECTRONANALYSER[electronanalyser]/DETECTOR[detector]": { |
| 115 | + "/ENTRY[entry]/INSTRUMENT[instrument]/ELECTRONANALYZER[electronanalyzer]/ELECTRON_DETECTOR[detector]": { |
118 | 116 | "amplifier_type": "MCP", |
119 | | - "detector_type": "DLD", |
120 | | - "sensor_pixels": [2024, 2048] |
| 117 | + "detector_type": "DLD" |
121 | 118 | }, |
122 | | - "/ENTRY[entry]/INSTRUMENT[instrument]/sourceTYPE[source_probe]": { |
| 119 | + "/ENTRY[entry]/INSTRUMENT[instrument]/source_probe": { |
123 | 120 | "name": "@attrs:metadata/scientificMetadata/Source/name", |
124 | 121 | "probe": "@attrs:metadata/scientificMetadata/Source/probe", |
125 | 122 | "type": "@attrs:metadata/scientificMetadata/Source/type", |
|
128 | 125 | "frequency/@units": "@attrs:metadata/scientificMetadata/Source/repetition_rate/unit", |
129 | 126 | "associated_beam": "/entry/instrument/beam_probe" |
130 | 127 | }, |
131 | | - "/ENTRY[entry]/INSTRUMENT[instrument]/beamTYPE[beam_probe]": { |
| 128 | + "/ENTRY[entry]/INSTRUMENT[instrument]/beam_probe": { |
132 | 129 | "distance": 0.0, |
133 | 130 | "distance/@units": "mm", |
134 | 131 | "incident_energy": "@attrs:metadata/scientificMetadata/Source/photon_energy/value", |
|
146 | 143 | "energy_dispersion": "@attrs:metadata/scientificMetadata/Source/dispersion/value", |
147 | 144 | "energy_dispersion/@units": "@attrs:metadata/scientificMetadata/Source/dispersion/unit" |
148 | 145 | }, |
149 | | - "/ENTRY[entry]/INSTRUMENT[instrument]/sourceTYPE[source_pump]": { |
| 146 | + "/ENTRY[entry]/INSTRUMENT[instrument]/source_pump": { |
150 | 147 | "name": "PIGLET @ FLASH @ DESY", |
151 | 148 | "probe": "visible light", |
152 | 149 | "type": "Optical Laser", |
153 | 150 | "mode": "Single Bunch", |
154 | | - "frequency": 1000, |
| 151 | + "frequency": 1000.0, |
155 | 152 | "frequency/@units": "kHz", |
156 | 153 | "associated_beam": "/entry/instrument/beam_pump" |
157 | 154 | }, |
158 | | - "/ENTRY[entry]/INSTRUMENT[instrument]/beamTYPE[beam_pump]": { |
| 155 | + "/ENTRY[entry]/INSTRUMENT[instrument]/beam_pump": { |
159 | 156 | "distance": 0.0, |
160 | 157 | "distance/@units": "mm", |
161 | 158 | "incident_wavelength": "@attrs:metadata/scientificMetadata/Laser/wavelength/value", |
|
195 | 192 | "gas_pressure_env": { |
196 | 193 | "pressure_gauge": "@link:/entry/instrument/pressure_gauge" |
197 | 194 | }, |
198 | | - "bias": { |
| 195 | + "bias_env": { |
199 | 196 | "voltmeter": "@link:/entry/instrument/manipulator/sample_bias_voltmeter" |
200 | 197 | } |
201 | 198 | }, |
|
207 | 204 | "data/@units": "counts", |
208 | 205 | "AXISNAME[*]": "@data:*.data", |
209 | 206 | "AXISNAME[*]/@units": "@data:*.unit", |
210 | | - "energy/@type": "@attrs:metadata/energy_calibration/calibration/energy_scale" |
| 207 | + "AXISNAME[energy]/@type": "@attrs:metadata/energy_calibration/calibration/energy_scale" |
211 | 208 | } |
212 | 209 | } |
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